Investigation of FinFET as a Temperature Nano-Sensor Based...

IOP Conference Series Materials Science and Engineering 2017 / 08 Vol. 226

Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type

Hashim, Yasir
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Volume:
226
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/226/1/012123
Date:
August, 2017
File:
PDF, 849 KB
english, 2017
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