[IEEE 2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol (Altai Republic), Russia (2018.6.29-2018.7.3)] 2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - The Comparative Analysis of the Maximum Slew Rate of the Output Voltage BJT and CMOS (SiGe TSMC 0.35µ) Operational Amplifiers
Prokopenko, Nikolay N., Butyrlagin, Nikolay V., Bugakova, Anna V.Year:
2018
Language:
english
DOI:
10.1109/EDM.2018.8435058
File:
PDF, 4.09 MB
english, 2018