A novel analysis of Lgd dependent-1/f noise in...

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IEEE Electron Device Letters 2018

A novel analysis of Lgd dependent-1/f noise in In0.08Al0.92N/GaN fin-HEMTs

Seo, Jae Hwa, Yoon, Young Jun, Son, Dong-Hyeok, Kim, Jeong-Gil, Lee, Jong-Ho, Lee, Jung-Hee, Im, Ki-Sik, Kang, In Man
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Year:
2018
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2018.2865564
File:
PDF, 895 KB
english, 2018
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