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Sensitive measurement of stress birefringence of fused silica substrates with cavity ring-down technique
Xiao, Shilei, Li, Bincheng, Cui, Hao, Wang, JingVolume:
43
Language:
english
Journal:
Optics Letters
DOI:
10.1364/OL.43.000843
Date:
February, 2018
File:
PDF, 1.66 MB
english, 2018