![](/img/cover-not-exists.png)
[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI, USA (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - Learning option MDPs from small data
Zehfroosh, Ashkan, Tanner, Herbert G., Heinz, JeffreyYear:
2018
Language:
english
DOI:
10.23919/ACC.2018.8431418
File:
PDF, 390 KB
english, 2018