[IEEE 2018 Annual American Control Conference (ACC) -...

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[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI, USA (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - $\mathbf{N}-(k_{1}, k_{2})$-detectability of Discrete Event Systems Under Nondeterministic Observations

Zhou, Lei, Shu, Shaolong, Lin, Feng
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Year:
2018
Language:
english
DOI:
10.23919/ACC.2018.8431748
File:
PDF, 322 KB
english, 2018
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