[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI, USA (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - Combining Subsystem and Full System Data with Application to Cold-Formed Steel Shear Wall
Wang, Long, Bian, Guanbo, Spall, James C., Schafer, Benjamin W.Year:
2018
Language:
english
DOI:
10.23919/ACC.2018.8431830
File:
PDF, 762 KB
english, 2018