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Monte Carlo ray-trace diffraction based on the Huygens–Fresnel principle
Mahan, J. R., Vinh, N. Q., Ho, V. X., Munir, N. B.Volume:
57
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.57.000D56
Date:
June, 2018
File:
PDF, 1.73 MB
english, 2018