Time-of-flight secondary ion mass spectrometry study on...

Thin Solid Films 2018 / 09 Vol. 661

Time-of-flight secondary ion mass spectrometry study on Be/Al-based multilayer interferential structures

Drozdov, M.N., Drozdov, Y.N., Chkhalo, N.I., Polkovnikov, V.N., Yunin, P.A., Chirkin, M.V., Gololobov, G.P., Suvorov, D.V., Fu, D.J., Pelenovich, V., Tolstogouzov, A.
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Volume:
661
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2018.07.013
Date:
September, 2018
File:
PDF, 1.96 MB
english, 2018
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