Full-field thickness measurement of ultrathin liquid film...

Full-field thickness measurement of ultrathin liquid film in receding contact-induced nano-channel using surface plasmon resonance

Kim, Iltai (Isaac), Paik, Sokwon, Jeon, Yang Bae, Park, Jae Sung, Kim, Hyunjung, Kim, Hongchul
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Volume:
26
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.26.020975
Date:
August, 2018
File:
PDF, 3.97 MB
english, 2018
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