Multi-state failure phenomenon and analysis using Semi-Markov Model
Dhawalikar, Mahesh Narayan, Mariappan, V., Srividhya, P. K., Kurtikar, Vishal, van der Wiele, TonLanguage:
english
Journal:
International Journal of Quality & Reliability Management
DOI:
10.1108/IJQRM-01-2016-0001
Date:
August, 2018
File:
PDF, 394 KB
english, 2018