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In situ Imaging of Materials using X-ray Tomography
Patterson, Brian M., Cordes, Nikolaus L., Henderson, Kevin, Xiao, Xianghui, Chawla, NikhileshVolume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618005500
Date:
August, 2018
File:
PDF, 191 KB
english, 2018