In situ Imaging of Materials using X-ray Tomography

Microscopy and Microanalysis 2018 / 08 Vol. 24; Iss. S1

In situ Imaging of Materials using X-ray Tomography

Patterson, Brian M., Cordes, Nikolaus L., Henderson, Kevin, Xiao, Xianghui, Chawla, Nikhilesh
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Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618005500
Date:
August, 2018
File:
PDF, 191 KB
english, 2018
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