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Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
Baykara, Mehmet Z, Dagdeviren, Omur E, Schwendemann, Todd C, Mönig, Harry, Altman, Eric I, Schwarz, Udo DVolume:
3
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.3.73
Date:
September, 2012
File:
PDF, 8.54 MB
english, 2012