Random Positional Deviations Correction for Each LED via...

IEEE Access 2018 Vol. 6

Random Positional Deviations Correction for Each LED via ePIE in Fourier Ptychographic Microscopy

Chen, Sining, Xu, Tingfa, Zhang, Jizhou, Wang, Xing, Zhang, Yizhou
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Volume:
6
Year:
2018
Language:
english
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2018.2849010
File:
PDF, 3.83 MB
english, 2018
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