An Incremental Algorithm for Soft Error Rate Estimation of Combinational Circuits
Ghavami, Behnam, Raji, Mohsen, Saremi, Kiarash, Pedram, HosseinYear:
2018
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2018.2865179
File:
PDF, 1.56 MB
english, 2018