Characterization of Schottky Diodes on 4H-SiC with Various...

Materials Science Forum 2008 / 9 Vol. 600-603

Characterization of Schottky Diodes on 4H-SiC with Various Off-Axis Angles Grown by Sublimation Epitaxy

Nakamura, Mitsutaka, Hashino, Yoshikazu, Furusho, Tomoaki, Kinoshita, Hiroyuki, Shiomi, Hiromu, Yoshimoto, Masahiro
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Volume:
600-603
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.600-603.967
Date:
September, 2008
File:
PDF, 266 KB
english, 2008
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