Winding Turn-to-Turn Short-Circuit Diagnosis using FRA...

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IET Science Measurement & Technology 2018 / 08

Winding Turn-to-Turn Short-Circuit Diagnosis using FRA Method: Sensitivity of Measurement Configuration

Harid, Noureddine, Devadiga, Anurag, Griffiths, Hugh, Al Sayari, Naji, Jayaram, Shesha, Braham, Barkat, Ikeda, Hisatoshi, Koshizuka, Tadashi, Taniguchi, Y
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Language:
english
Journal:
IET Science, Measurement & Technology
DOI:
10.1049/iet-smt.2018.5331
Date:
August, 2018
File:
PDF, 1.47 MB
english, 2018
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