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Wafer-Scale Method of Controlling Impurity-Induced Disordering for Optical Mode Engineering in High-Performance VCSELs
Su, Patrick, Hsiao, Fu-Chen, OrBrien, Thomas, Dallesasse, John M.Year:
2018
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2018.2866065
File:
PDF, 733 KB
english, 2018