Wafer-Scale Method of Controlling Impurity-Induced...

  • Main
  • 2018
  • Wafer-Scale Method of Controlling Impurity-Induced...

Wafer-Scale Method of Controlling Impurity-Induced Disordering for Optical Mode Engineering in High-Performance VCSELs

Su, Patrick, Hsiao, Fu-Chen, OrBrien, Thomas, Dallesasse, John M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2018
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2018.2866065
File:
PDF, 733 KB
english, 2018
Conversion to is in progress
Conversion to is failed