Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices
Todorov, R., Tasseva, J., Lozanova, V., Lalova, A., Iliev, Tz., Paneva, A.Volume:
2013
Year:
2013
Language:
english
Journal:
Advances in Condensed Matter Physics
DOI:
10.1155/2013/308258
File:
PDF, 1.90 MB
english, 2013