Ellipsometric Characterization of Thin Films from...

Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices

Todorov, R., Tasseva, J., Lozanova, V., Lalova, A., Iliev, Tz., Paneva, A.
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Volume:
2013
Year:
2013
Language:
english
Journal:
Advances in Condensed Matter Physics
DOI:
10.1155/2013/308258
File:
PDF, 1.90 MB
english, 2013
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