High I on /...

Beilstein Journal of Nanotechnology 2015 / 10 Vol. 6

High I on / I off current ratio graphene field effect transistor: the role of line defect

Tajarrod, Mohammad Hadi, Saghai, Hassan Rasooli
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Volume:
6
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.6.210
Date:
October, 2015
File:
PDF, 2.38 MB
english, 2015
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