X-ray absorption spectroscopy by full-field X-ray...

Beilstein Journal of Nanotechnology 2012 / 04 Vol. 3

X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

Bittencourt, Carla, Hitchock, Adam P, Ke, Xiaoxing, Van Tendeloo, Gustaaf, Ewels, Chris P, Guttmann, Peter
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Volume:
3
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.3.39
Date:
April, 2012
File:
PDF, 3.12 MB
english, 2012
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