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Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices
Gysin, Urs, Glatzel, Thilo, Schmölzer, Thomas, Schöner, Adolf, Reshanov, Sergey, Bartolf, Holger, Meyer, ErnstVolume:
6
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.6.258
Date:
December, 2015
File:
PDF, 5.46 MB
english, 2015