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Morphology of SiO 2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
Tkachenko, Volodymyr, Marino, Antigone, Otón, Eva, Bennis, Noureddine, Otón, Josè ManuelVolume:
7
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.7.167
Date:
November, 2016
File:
PDF, 949 KB
english, 2016