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AIP Conference Proceedings [Author(s) SILICONPV 2018, THE 8TH INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS - Lausanne, Switzerland (19–21 March 2018)] - Refractive index of PECVD-SiNy rear passivation films and its effect on assisted passivation of PERCs
Joonwichien, Supawan, Kida, Yasuhiro, Moriya, Masaaki, Utsunomiya, Satoshi, Shirasawa, Katsuhiko, Takato, HidetakaVolume:
1999
Year:
2018
Language:
english
DOI:
10.1063/1.5049292
File:
PDF, 860 KB
english, 2018