Mapping Subsurface Composition with Attogram Sensitivity using Micro-XRF
Gelb, Jeff, Stripe, Benjamin, Yang, Xiaolin, Lewis, Sylvia, Lau, SH, Yun, WenbingVolume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927618005779
Date:
August, 2018
File:
PDF, 802 KB
english, 2018