![](/img/cover-not-exists.png)
Method for Extracting True Stress from TEM in situ Compression Testing
Qu, Haozheng, Yano, Kayla H., Patki, Priyam V., Wharry, Janelle P.Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927618009613
Date:
August, 2018
File:
PDF, 3.06 MB
english, 2018