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Detection Mechanism of Parallel Defect using Scanning Inductive Thermography
Zuo, Xianzhang, Song, Benchu, Hu, Yongjiang, He, YunzeVolume:
207
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/207/1/012090
Date:
June, 2017
File:
PDF, 556 KB
english, 2017