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[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Reliability evaluation of defect accounted time-dependent dielectric breakdown with competing-mixture distribution
Yokogawa, Shinji, Tate, KazukiYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353662
File:
PDF, 245 KB
english, 2018