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[IEEE 2018 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C) - Lisbon (2018.7.16-2018.7.20)] 2018 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C) - MuNN: Mutation Analysis of Neural Networks
Shen, Weijun, Wan, Jun, Chen, ZhenyuYear:
2018
Language:
english
DOI:
10.1109/QRS-C.2018.00032
File:
PDF, 1.41 MB
english, 2018