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TCAD analysis and modeling for NBTI mechanism in FinFET transistors
Herrera-Moreno, Alfonso, García-Gervacio, José Luis, Villacorta-Minaya, Héctor, Vázquez-Leal, HéctorVolume:
15
Year:
2018
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.15.20180502
File:
PDF, 2.37 MB
english, 2018