Cryogenic Characterization of 28-nm FD-SOI Ring Oscillators...

IEEE Transactions on Electron Devices 2018 / 9 Vol. 65; Iss. 9

Cryogenic Characterization of 28-nm FD-SOI Ring Oscillators With Energy Efficiency Optimization

Bohuslavskyi, H., Barraud, S., Barral, V., Casse, M., Le Guevel, L., Hutin, L., Bertrand, B., Crippa, A., Jehl, X., Pillonnet, G., Jansen, A. G. M., Arnaud, F., Galy, P., Maurand, R., De Franceschi, S
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2859636
Date:
September, 2018
File:
PDF, 1.89 MB
english, 2018
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