VLSI Test Principles and Architectures || Logic Built-In...

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VLSI Test Principles and Architectures || Logic Built-In Self-Test

Wang, Laung-Terng (L.-T.)
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Year:
2006
Language:
english
DOI:
10.1016/b978-012370597-6/50009-3
File:
PDF, 916 KB
english, 2006
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