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Ultramicroscopy 2018 / 9

Advanced Detector Signal Acquisition and Electron Beam Scanning for High Resolution SEM Imaging

Lenthe, William C., Stinville, Jean Charles, Echlin, McLean P., Chen, Zhe, Daly, Samantha, Pollock, Tresa M.
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Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2018.08.025
Date:
September, 2018
File:
PDF, 2.07 MB
english, 2018
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