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Pulse Compression in Nondestructive Testing Applications: Reduction of Near Sidelobes Exploiting Reactance Transformation
Burrascano, Pietro, Laureti, Stefano, Senni, Luca, Ricci, MarcoYear:
2018
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/TCSI.2018.2862868
File:
PDF, 4.72 MB
english, 2018