Assessment of a Decaying DC Offset Detector on CTs Measurements Applying Mathematical Morphology
Celeita Rodriguez, David Felipe, Perez Osorio, Juan David, Ramos, GustavoYear:
2018
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/TIA.2018.2867530
File:
PDF, 2.14 MB
english, 2018