Diversity of Properties of Device Structures Based on Group-III Nitrides, Related to Modification of the Fractal-Percolation System
Emtsev, V. V., Gushchina, E. V., Petrov, V. N., Tal’nishnih, N. A., Chernyakov, A. E., Shabunina, E. I., Shmidt, N. M., Usikov, A. S., Kartashova, A. P., Zybin, A. A., Kozlovski, V. V., Kudoyarov, M.Volume:
52
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782618070072
Date:
July, 2018
File:
PDF, 425 KB
english, 2018