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Raman analysis of strain in p-type doped silicon nanostructures
Ureña-Begara, Ferran, Vayrette, Renaud, Bhaskar, Umesh Kumar, Raskin, Jean-PierreVolume:
124
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5045736
Date:
September, 2018
File:
PDF, 1.64 MB
english, 2018