Confocal Micro X-Ray Fluorescence: A New Paradigm in Materials Characterization
Patterson, Brian M., Havrilla, George J., DeFriend, Kimberly A.Volume:
16
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500059770
Date:
July, 2008
File:
PDF, 1.16 MB
english, 2008