High Resolution S/TEM Study of Defects in MOCVD Grown Mono...

Microscopy and Microanalysis 2018 / 08 Vol. 24; Iss. S1

High Resolution S/TEM Study of Defects in MOCVD Grown Mono to Few Layer WS2

Bachu, Saiphaneendra, Hickey, Danielle Reifsnyder, Choudhury, Tanushree H, Chubarov, Mikhail, Redwing, Joan M, Alem, Nasim
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Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927618008668
Date:
August, 2018
File:
PDF, 1.26 MB
english, 2018
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