Raman analyses of residual stress in diamond thin films...

Materials Research 2003 / 01 Vol. 6; Iss. 1

Raman analyses of residual stress in diamond thin films grown on Ti6Al4V alloy

Azevedo, Adriana F., Corat, Evaldo J., Leite, Nélia F., Ferreira, Neidenei G., Trava-Airoldi, Vladimir J.
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Volume:
6
Language:
english
Journal:
Materials Research
DOI:
10.1590/S1516-14392003000100010
Date:
January, 2003
File:
PDF, 708 KB
english, 2003
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