Dependence of Hysteresis on Perovskite Film Thickness:...

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Dependence of Hysteresis on Perovskite Film Thickness: Inverse Behavior between TiO2 and PCBM in Normal Planar Structure

Cho, An-Na, Jang, In-Hyuk, Seo, Ja-Young, Park, Nam-Gyu
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Year:
2018
Language:
english
Journal:
Journal of Materials Chemistry A
DOI:
10.1039/c8ta04919j
File:
PDF, 1.39 MB
english, 2018
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