Universal scaling behavior of the upper critical field in strained FeSe0.7Te0.3 thin films
Yuan, Feifei, Grinenko, Vadim, Iida, Kazumasa, Richter, Stefan, Pukenas, Aurimas, Skrotzki, Werner, Sakoda, Masahito, Naito, Michio, Sala, Alberto, Putti, Marina, Yamashita, Aichi, Takano, Yoshihiko,Language:
english
Journal:
New Journal of Physics
DOI:
10.1088/1367-2630/aade66
Date:
September, 2018
File:
PDF, 2.84 MB
english, 2018