Enhancing Flash Memory Reliability by Jointly Considering...

ACM Transactions on Design Automation of Electronic Systems 2018 / 08 Vol. 23; Iss. 5

Enhancing Flash Memory Reliability by Jointly Considering Write-back Pattern and Block Endurance

Chen, Tseng-Yi, Chang, Yuan-Hao, Kuan, Yuan-Hung, Yang, Ming-Chang, Chang, Yu-Ming, Hsiu, Pi-Cheng
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Volume:
23
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/3229192
Date:
August, 2018
File:
PDF, 5.80 MB
english, 2018
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