Mapping Intrinsic Electromechanical Responses at the Nanoscale via Sequential Excitation Scanning Probe Microscopy Empowered by Deep Data
Huang, Boyuan, Esfahani, Ehsan Nasr, Li, JiangyuLanguage:
english
Journal:
National Science Review
DOI:
10.1093/nsr/nwy096
Date:
September, 2018
File:
PDF, 935 KB
english, 2018