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[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Resolving Trap-caused Charges by Scanning Microwave Microscopy
Hommel, S., Killat, N., Schweinboeck, T., Altes, A., Kreupl, F.Year:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452526
File:
PDF, 4.05 MB
english, 2018