[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Failure Analysis and Improvement of the Body Diode in Superjunction Power MOSFET
Ren, Min, Yang, Mengqi, Zhong, Shengrong, Xie, Chi, Li, Zehong, Gao, Wei, Zhang, Jinping, Zhang, BoYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452547
File:
PDF, 837 KB
english, 2018