SAE Technical Paper Series [SAE International SAE 2015 World Congress & Exhibition - (APR. 21, 2015)] SAE Technical Paper Series - Improved ECU End of Line Testing using Multicore Microcontroller
Kazmi, Syed Arshad, Park, Jin Seo, Harnisch, JensVolume:
1
Year:
2015
Language:
english
DOI:
10.4271/2015-01-0186
File:
PDF, 1.06 MB
english, 2015