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[AIP 4th International workshop on: Slow−positron beam techniques for solids and surfaces - Ontario (Canada) (3−6 Jul 1990)] AIP Conference Proceedings - Positron annihilation spectroscopy of ion beam induced damage in silicon
Mitchell, I. V., Simpson, P. J., Schultz, P. J., Vos, M., Akano, U., Wu, C.Volume:
218
Year:
1991
Language:
english
DOI:
10.1063/1.40188
File:
PDF, 666 KB
english, 1991