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[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Performance Variability, Switching Mechanism, and Physical Model for Oxide Based Memristor and RRAM Device
Lian, Xiaojuan, Gao, Fei, Wan, Xiang, Yao, Jiafei, Gong, Xiao, Guo, Yufeng, Tong, YiYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452585
File:
PDF, 742 KB
english, 2018