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[IEEE 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018 - Philadelphia, PA, USA (2018.6.10-2018.6.15)] 2018 IEEE/MTT-S International Microwave Symposium - IMS - A GaN Single-Chip Front-End for Active Electronically Scanned Arrays
Ciccognani, W., Colangeli, S., Costanzo, F., Giofre, R., Polli, G., Salvucci, A., Vittori, M., Limiti, E., Sotgia, M., Cirillo, M.Year:
2018
Language:
english
DOI:
10.1109/MWSYM.2018.8439353
File:
PDF, 279 KB
english, 2018